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approvedfurchner___osi_11___1_page_summary.pdf2015-03-30 09:25:38Andreas Furchner


Author: Andreas Furchner
Requested Type: Pre-Selected Invited
Submitted: 2015-03-13 09:57:10


Contact Info:
Leibniz-Institut für Analytische Wissenschaften -
Schwarzschildstr. 8
Berlin,   12489

Abstract Text:
Ellipsometry is a powerful non-destructive polarization-dependent technique for studying the optical and structural properties of functional polymer surfaces and interfaces of organic thin films. Employing ellipsometry in the infrared spectral range enables one to probe the characteristic vibrational fingerprints that are associated with film chemistry and molecular structure. In combination with a special flow cell that has a well-defined optical path, infrared ellipsometry is applicable for in-situ studies of solid--vapor or solid--liquid interfaces in dependence of humidity, pH or salt concentration of the solution, temperature, and other parameters. Quantitative evaluation of measured optical spectra via optical simulations provides deep insights into stimuli-dependent film structure, composition, anisotropy, hydration state, and interactions.

In-situ infrared ellipsometry offers unprecedented potential for organic-thin-film analysis in aqueous environment. The method is applied for investigations of the swelling behavior of hydrophobic and hydrophilic ultra-thin polymer films and brushes, the quantification of polymer--water interactions in temperature-sensitive polymer brushes, as well as protein-adsorption and structure studies on various temperature- and pH-responsive polymer brushes.